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VLSI Test System
3380P - Chroma ATE Inc.
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
Test System
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VLSI Test System
3380D - Chroma ATE Inc.
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VLSI Test System
3380 - Chroma ATE Inc.