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Bit Error Rate Tester - PXI
BERT 1001/1005 Series
The BERT is 2 or 4-channel PPG and Error Detector for the design, characterization and production of optical transceivers and opto-electrical components at data rates up to 30 Gb/s.With scalability and exceptional signal fidelity, it is a cost effective test solution for 400 Gb/s communication eco-systems.
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Bit Error Rate Tester - MATRIQ
The BERT is 2 or 4-channel PPG and Error Detector for the design, characterization and production of optical transceivers and opto-electrical components at data rates up to 30 Gb/s.With scalability and exceptional signal fidelity, it is a cost effective test solution for 400 Gb/s communication eco-systems.
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PAM4 Bit Error Rate Tester.
BERT-1102
The BERT-1102 is a 4 or 8-channel PPG and Error Detector for the design, characterization and manufacturing test of optical transceivers and opto-electrical components with symbol rates up to 29 GBaud/s in both NRZ and PAM4 formats. With scalability and exceptional signal fidelity, it is a cost-effective test solution for up to 400 Gb/s communication eco-systems.
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ABex PXI to Analog Bus Bridge with Digital IOs
ABex AM-300 Controller
The ABex system controller ABex AM-300 is required to control the analog bus of a ABex chassis. It is used as an interconnection bridge between PXI and ABex backplane.In addition it features a whole bunch of additional functionality. Despite the 96 open drain outputs it has galvanically isolated IOs, and communication interfaces.
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Automated Coherent Receiver Tester
CoRx Tester.
Quantifi Photonics’ CoRx Tester provides automated measurement of key coherent receiver performance parameters. The CoRx Tester is comprised of a pre-configured PXI chassis, a two-channel tunable laser, a polarization controller, and a two-channel Variable Optical Attenuator (VOA) with built-in power meter. Just connect the two optical outputs to your Integrated Coherent Receiver (ICR), connect your ICR to the oscilloscope and let the CoRx Tester software do all the rest.
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MTM-Bus Tester
PXIe-1149.5
The Corelis PXIe-1149.5 is a versatile, multi-mode instrument for interfacing with MTM-Bus modules. The PXIe-1149.5 adds MTM-Bus master, slave, and monitoring with full IEEE-1149.5 electrical and protocol compatibility with a standard PXIe interface for convenient integration into any Test Program Set (TPS).
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Cable Testers
CableJoG 64
CableJoG 64 can test up to 64 individual connections of all manufacturers of connectors. This simple test instrument stores up to 55 separate connection configurations. Each cable that is tested is compared with the configuration stored in the cable testers memory to produce a pass/fail indication of each pin connection.
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Digital Leeb Hardness Tester
TIME®5310
Beijing TIME High Technology Ltd.
TIME5310 is an advanced digital Leeb hardness tester developed with advanced micro electronic technology. It is loaded with all the features for metal hardness testing, such as probe auto recognition, large memory, USB output, removable printer, software, etc. The improved display makes it is much easier to read the values. TIME5310 digital hardness meter is a must have for testing in the field or in the lab. By the way, there are newly designed probes for this hardness meter now.
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Audio Cable Testers
AudioJog Pro 3
Audio cable tester with SINGLE & DOUBLE ended testing, memory and intermittent fault detection .
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Network Cable Tester
LightingJoG Rack 8
Sensational 19 inch 2U rack mount Lighting/Network cable tester with SINGLE & DOUBLE ended testing, memory and intermittent fault detection.
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Memory Device Tester
T5822
Wafer-level testing of DRAMs, NAND devices and other non-volatile memories used throughout portable electronic devices. The T5822 is designed to provide manufacturers of multiple memory devices with cost efficiency and optimal functionality, including full test coverage of as many as 1,536 devices in parallel with data transfer rates up to 1.2 gigabits per second (Gbps).
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Memory Burn-in Tester
B6700 Series
B6700 can test as many as 48 burn-in boards in parallel at speeds up to 10 MHz, which helps memory suppliers get their newest products to market faster while also reducing testing costs. An original high performance chamber improves yield by assuring high temperature accuracy while generating high temperature. It also shortens the temperature rise and fall time which leads to shortening the test time.
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Network Cable Tester
AudioJoG Pro 8 Power
Audio/Lighting/Network cable tester with SINGLE & DOUBLE ended testing with memory and intermittent fault detection.
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Semiconductor Memory Tester
T5851
Advantest Corporation has introduced the T5851 system, designed to provide a cost-effective test solution for high-performance universal flash storage (UFS) devices and PCIe BGA solid-state drives (SSDs) memory ICs in high demand by makers of low-power, mobile applications such as smart phones, tablets and ultra-portable laptops. The flexible T5851 tester is available in both production and engineering models. This allows the system to be used for reliability and qualification testing as well as test-program development or, when equipped with an automated component handler such as Advantest''''s M6242, high-volume production. As a fully integrated, system-level test solution, the T5851 provides multi-protocol support in one tool while its tester-per-DUT architecture and proprietary hardware accelerator allow it to achieve industry-leading test times.
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Memory Tester for DDR4 DIMMS
RAMCHECK LX
USBWith the RAMCHECK LX DDR4 memory tester package (part number INN-8686-DDR4) you can quickly test and identify DDR4 DIMMs that comply with JEDEC standards. Tests are fast, reliable and easy to do. The RAMCHECK LX DDR4 package includes the RAMCHECK LX base tester and 288-pin DDR4 DIMM adapter. (This package is also available with the DDR4 DIMM Pro adapter, featuring a very rugged test socket).
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Memory Tester
RAMCHECK LX DDR3
Quickly test DDR3 DIMM and SO-DIMM memory. In just seconds, RAMCHECK LX will perform a thorough test of the module and provide complete identification. Also tests expensive LRDIMM modules.
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Memory Tester
RAMCHECK
RAMCHECK is our most advanced memory tester and is the latest in our product line. Highly modular and user friendly, it redefines the capabilities of an affordable and portable ram checker.
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Test Adapter
Ramcheck 100
This addition to the RAMCHECK memory tester provides needed support for testing of SDRAM and standard EDO/FPM DRAM 100-pin SO DIMM modules at an affordable price.
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Test Adapter
Ramcheck 72 Pro
Our latest addition to the RAMCHECK memory tester provides needed support for testing 72-pin SO DIMM modules used in older laptop computers. The RAMCHECK memory tester automatically detects the presence of the RC 72 Pro adapter
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Single Event Effects Test System
SEE-RAD
The SEE-RAD test system brings together the proven features of our ETS780 tester (such as true APG memory test and powerful FA tools) with the newest technology of the Griffin III. With all new high-accuracy DC Parametrics, superior precision pin drivers, and capture memory of 64M, the Griffin SEE-RAD combines the newest innovations in the test industry with our years of experience in Radiation Test.
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Vigorous Memory Testing
R.S.T. Family
Memory is one of the most notoriously difficult core system functions to troubleshoot, exercise, and validate. PC's are not only being equipped with increasingly large amounts of RAM but their often complex system hardware and software configurations can make it even more difficult to determine if a problem is truly a RAM failure. Such problems vary with different combinations of chipsets, processors or motherboards. R.S.T. 4 Premium''''s capabilities far exceed those of stand-alone testers in meeting all of these challenges.
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SD Host Tester / SD / EMMC Analyzer / SD Card Tester
SGDK320A (SD Host Tester)
SGDK320A (SD Host Tester) is a product that has the functions of SD emulator (SD Emulator), host tester (Host Tester), SD analyzer (SD Analyzer), and eMMC analyzer (eMMC Analyzer). Supports SD Memory Card Physical Layer Specification Version 3.01. It covers the test contents of Test Specification Ver3.00 and Supplement Note. Supports SDR104 and eMMC ver4.41 (analyzer).
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Component Testers
After a wafer is tested through front-end test and back-end test, the component tester tests this final component or package assuring its quality for the semiconductor makers. DDR, DDR2, DDR3 memory component testers.
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Application Level Tester
The application tester tests the memory devices such as graphic memory and HDD buffer memory in a specially designed condition made similar to actual PC and Server environments. In fact the graphic memory has releatively higher speed, test expense and quality standard compared to main memory, stressing the importance and the need of the application tester.
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RAMCHECK LX DDR4 Memory Tester
INN-8686-DDR4
The RAMCHECK LX DDR4 quickly and accurately tests and identifies DDR4 DIMMs for servers and desktops, as well as laptop SODIMMs.
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Test Adapter
RAMCHECK® SIMM
The RAMCHECK SIMM Adapter is another addition to the RAMCHECK memory tester. It provides a needed solution for testing older 72-pin EDO/FPM DRAM SIMM modules. An optional adapter for 30 and 72-pin SIMMs is also available
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Hi-Pot Tester
DU3315/3316
Delta United Instrument Co., Ltd.
3 in 1 tester with AC, DC, IR functions ( IR function is optional for DU3316 only)ARC Detction:DU3315 /DU3316 Standard function40 x 4 LCD text displayFast cut-off time : 0.4ms5 sets of memory, 3 steps for each memory
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Hi-Pot Tester
DU3315A/3316A
Delta United Instrument Co., Ltd.
Real-time Open Check of the alarm and signal output of no contact signal3 in 1 tester with AC, DC, IR functions ( IR function is optional for DU3316 only)ARC Detction:DU3315A /DU3316A Standard function40 x 4 LCD text displayFast cut-off time : 0.4ms5 sets of memory, 3 steps for each memory
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Memory Module Testers
The module tester tests the modules in which the final tested components are assembled together. This test is also one of the most important factors to guarantee the quality of the products. DDR, DDR2, DDR3, FBDIMM,
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Hardness Testers
Guangzhou Amittari Instruments Co.Ltd
Memory Foam Hardness Tester AS-120MF, special for memory foam hardness measurement.(memory foam is also known as slow rebound sponge, space zero pressure, space foam, TEMPUR material, low rebound sponge material, viscoelastic, used in high velocity ofaerospace, aviation, equipment, high-end consumer goods.)
