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Memory Device
directly accessible computer's internal or main memory.
See Also: Memory, Memory Test, DDR, NAND, DRAM, RAM, ROM, Memory Testers, DUT
- Pickering Interfaces Inc.
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PXI Three Channel Function Generator
Our PXI Function Generator is capable of generating sine, square and triangle waveforms to 10MHz with 48-bit frequency resolution referenced to the 10MHz PXI clock or to an external standard. It can generate fast swept frequency signals, permitting the output to emulate the operation of variable speed devices. The module can also generate arbitrary waveforms loaded into its internal 256k memory, allowing the emulation of many waveform types including the typical waveforms of automotive and aerospace sensors.
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Memory Device Tester
T5822
Wafer-level testing of DRAMs, NAND devices and other non-volatile memories used throughout portable electronic devices. The T5822 is designed to provide manufacturers of multiple memory devices with cost efficiency and optimal functionality, including full test coverage of as many as 1,536 devices in parallel with data transfer rates up to 1.2 gigabits per second (Gbps).
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Ultra-high Performance Solution for Memory Device Test
Magnum EPIC
Teradyne’s Magnum EPIC is a high-performance test solution for latest generation DRAM devices. These devices are key enablers for technologies like 5G, AI, cloud computing, autonomous vehicles, AR/VR and applications with high definition graphics.
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Memory Test Software
Teradyne’s customers count on us for our Near Device Under Test (DUT) technology that gives memory device manufacturers a guaranteed performance advantage. A brief description of dynamic memory and storage memory devices will highlight why device manufacturers depend on Teradyne’s memory test solutions.
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Application Level Tester
The application tester tests the memory devices such as graphic memory and HDD buffer memory in a specially designed condition made similar to actual PC and Server environments. In fact the graphic memory has releatively higher speed, test expense and quality standard compared to main memory, stressing the importance and the need of the application tester.
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FLASH Memory Endurance Cycling Systems
NTS3700 Series
FLASH memory endurance cycling systems are used to characterize and qualify the write/erase cycling endurance of FLASH memory devices, and to conduct functional testing of memory devices at extreme temperatures. A typical system consists of an environmental chamber, algorithmic pattern generator, programmable power supplies and system controller.Novtek’s systems can accommodate from 64 to 864 devices for parallel devices and . In addition to FLASH, the systems can also accommodate MRAM, EEPROM, EPROM, PROM (OUM), Mask ROM, SRAM, FeRAM, DRAM, PC Cards (PCMCIA), embedded FLASH microcontrollers and NVM based FPGA. The system's environmental chamber has a range of -55oC to +200oC and is ideal for temperature characterization of memory based devices and packages.
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Compute Express Link (CXL)
Compute Express Link (CXL) is a new high-speed CPU-to-Device and CPU-to-Memory interconnect designed to accelerate next-generation data center performance. CXL technology maintains memory coherency between the CPU memory space and memory on attached devices, which allows resource sharing for higher performance, reduced software stack complexity, and lower overall system cost. This permits users to simply focus on target workloads as opposed to the redundant memory management hardware in their accelerators. CXL is based on a PCI Express 5.0 Physical layer with speeds up to 32GT/s. Teledyne LeCroy provides protocol analysis test equipment to support development and debug of CXL based devices.
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Memory
Renesas offers MIL-STD-883-compliant CMOS random access memory (RAM) and CMOS programmable read-only memory (PROM) devices that are that are qualified to QML Class Q military standards.
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Power mixed test system
Power device or module with which are digitally controlled and memory can be measured per system.
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Memory Test System
T5833/T5833ES
T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
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Flash Memory Test System
T5830
T5830 memory tester, the latest member of its T5800 product family, optimized for testing a wide range of flash memory devices used in mobile electronic devices. The highly flexible T5830 tester has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories.
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Shield
Arduino MKR Mem Shield
Are you developing a complex IoT device with your MKR board and running out of memory? Add Flash memory and microSD storage to your MKR board, and allow over-the-air updates, with the Arduino MKR MEM Shield.
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Flash Device Test System
MS7208
The MS7208 system can test a wide range of device families including – but not limited to – NAND flash, NOR flash, multi-level flash, multi-die flash, EEPROM, RAM, and mixed-technology memory devices.
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Battery Testers
Memory & Read FunctionRight Device to know the TRUE -LIFE of Battery Capacity (Resistive / Voltage) Simultaneously MeasureOn - Line Testing without shutting down batteryBuilt - in Comparator FunctionRates Conditions as PASS, WARNING or FAILDatalogging Memory FunctionCompact and lightweightRS-232 Interface & SoftwareAuto Power Off
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External Data Storage Devices
External data storage devices can be used for redundant data storage, additional data storage, or convenient data retrieval from the field. These devices use a variety of technologies, including USB, flash memory, CompactFlash, and microSD.
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ECU Interfaces
ECU Interfaces are devices that connect to an ECU microcontroller directly as a memory emulator or through the debug port interface. The interface is typically through a direct replacement of the microcontroller, memory emulation, or through the debugger port. The method can be driven by what is supported on the microcontroller. ATI offerings support all approaches:
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NVR
Sylo Vision Technology Co., Limited
Is a software program that records video in a digital format to a disk drive, USB flash drive, SD memory card or other mass storage device. ... However, the software is typically run on a dedicated device, usually with an embedded operating system.
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Storage Technologies
We engage with companies across the storage landscape, from flash memory chips used in mobile devices to massive cloud data centers. And here is how!
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BeeProg2C Programmer
Universal Programmer memory, microcontrollers and PLDs. This supports systems 78324 Beeprog2c programmer Elnec company is an excellent choice for factories and businesses servicing the electronic devices
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Wafer Prober
Prexa MS
The latest fully automated 300mm wafer prober for memory devices. Featuring high rigidity and exceptional thermal control, the system enables full-wafer contact testing.
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Memory Module
Advantech Memory module and DRAM modules offer an extensive portfolio of industrial grade memory, like un-buffered DIMMs, LONG-DIMM and SO-DIMM which are designed according to the latest JEDEC standards and cover all technologies from DDR to DDR3 memory in wide temp ranges (-40 to 85C). Advantech Memory module and DRAM modules'' synchronous design allows precise cycle control with the use of system clock. I/O data transactions are possible on both edges of DQS. Range of operation frequencies, and programmable latencies allow the same device to be useful for a variety of high bandwidth, high performance memory system applications.
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High-Speed Memory Test Solution
UltraFLEX-M
The UltraFLEX-M builds on the advanced test technology and architecture of the proven UltraFLEX test system to ensure high test quality at the lowest cost of test for high-speed memory devices.
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Metrology System
Echo
The Echo system is a comprehensive in-line metal film metrology tool for single and multi-layer metal film measurements in leading-edge logic, memory, advanced packaging, and specialty semiconductor devices.
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High Speed Pick and Place Handler
Commander 2000
At throughput rates in excess of 2000 Units per Hour the HT Commander 2000 system provides unparalleled performance for the production handling and programming of flash memory devices or modules.
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3U OpenVPX Module Xilinx Zynq UltraScale
VPX3-ZU1
Sundance Multiprocessor Technology Ltd.
PanaTeQ’s VPX3-ZU1 is a 3U OpenVPX module based on the Zynq UltraScale+ MultiProcessor SoC device from Xilinx. The Zynq UltraScale+ integrates a Quad-core ARM Cortex-A53 based Application Processing Unit (APU), a Dual-core ARM Cortex-R5 based Real-Time Processing Unit (RPU), a ARM MALI-400 based Graphic Processing Unit (GPU) and an UltraScale+ Programmable Logic (PL) in a single device. It also includes on-chip memory, external memory interfaces, and a rich set of peripheral connectivity interfaces.
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IP Core and FPGA Products
Our FPGA offerings include development boards and IP cores for Altera FPGA devices. The IP cores include: I2C, PCIe, JPEG-LS, LVDS Camera Link and memory controllers.
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CMOS and HVMOS Modeling
Significant process technology advances, including miniaturization of devices and introduction of new configurations and materials have led to a more diverse range of product applications for silicon devices. Beyond the traditional logic and memory applications, a number of new applications for CMOS technology are being developed. These include advanced applications such as high voltage devices for flat panel displays and high power devices for automotive systems.
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BeeProg2
Universal Programmer USB / LPT memory, microcontrollers and PLDs. This allows systems to operate 82712 BeeProg 2 programmer Elnec company is an excellent choice for factories and businesses servicing the electronic devices
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Probe Cards
U-Probe for Multi-die Test of Memory IC. Vertical-Probe Needle Type Probe card suitable for multi-die test of devices with peripheral pads. ertical-Probe Spring Type. Probe card suitable for area array pad test. 64DUTs Multi-Die. Probe Card for RF devices. Fine Pitch.
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Semiconductor Testing
Teradyne’s semiconductor test portfolio is transforming the way you test chipsets for automotive, industrial, communications, consumer, smartphones, and computer and electronic game applications. Semiconductor devices span a broad range of functionality, from very simple low-cost devices such as appliance microcontrollers, operational amplifiers or voltage regulators to complex digital signal processors and microprocessors as well as memory devices.
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JTAGulator 24-Channel Hardware Hacking Tool
32115
On-chip debug (OCD) interfaces can provide chip-level control of a target device and are a primary vector used by engineers, researchers, and hackers to extract program code or data, modify memory contents, or affect device operation on-the-fly. JTAGulator is an open source hardware tool that assists in identifying OCD connections from test points, vias, or component pads on a target device.
