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Confocal FLIM System
DCS-120
*FLIM Upgrade for Existing Conventional Microscope*Two Fully Parallel TCSPC FLIM Channels*Compact bh Simple-Tau or Power-Tau System*Scanning by Fast Galvanometer Mirrors*Channel Seperation by Dichroic or Polarising Beamsplitters*Individually Selectable Pinholes and Filters*One or Two BDL-SMN or BDS-SM ps Diode Lasers*Two Fully Confocal Detection Channels*Two HPM-100-40 GaAsP Hybrid Detectors*Optional: Two HPM-100-06 Hybrid Detectors, IRF Width < 20 ps FWHM*Optional: HPM-100-50 Hybrid Detectors for NIR FLIM*Optional: Multi-Wavelength FLIM*Excellent Time Resolution: Electrical IRF Width 6.5 ps FWHM*Time Channel Width Down to 813 fs*Megapixel FLIM, Up to 2048 x 2048 Pixels at 256 Time Channels*Simultaneous FLIM/PLIM*Wideband Version, Compatible with Tuneable Lasers*Electronic Pinhole Alignment*Z-Stack FLIM Acquisition with Zeiss Axio Observer Z1*Optional: Spatial Mosaic FLIM via Motorized Sample Stage
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Confocal FLIM for Macroscopic Objects
DCS-120 Macro
*FLIM of Macroscopic Objects*Scan Field Up to 15 mm Diameter*Two Fully Parallel TCSPC FLIM Channels*Compact bh Simple-Tau or Power-Tau System*Scanning by Fast Galvanometer Mirrors*Channel Seperation by Dichroic or Polarising Beamsplitters*Individually Selectable Pinholes and Filters*One or Two BDL-SMN or BDS-SM ps Diode Lasers*Tuneable Excitation by Super-Continuum Laser with AOTF*Two Fully Parallel Detection Channels*Two HPM-100-40 GaAsP Hybrid Detectors*Optional: Two HPM-100-06 Hybrid Detectors, IRF Width < 20 ps FWHM*Optional: HPM-100-50 Hybrid Detectors for NIR FLIM*Optional: Multi-Wavelength FLIM*Excellent Time Resolution: Electrical IRF Width 6.5 ps FWHM*Time Channel Width Down to 813 fs*Megapixel FLIM, Up to 2048 x 2048 Pixels at 256 Time Channels*Simultaneous FLIM/PLIM*Wideband Version, Compatible with Tuneable Lasers*Electronic Pinhole Alignment*Optional: Spatial Mosaic FLIM via Motorized Sample Stage
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Spectroscopic Ellipsometers
SENresearch 4.0
The SENresearch 4.0 is the new SENTECH spectroscopic ellipsometer. Every individual SENresearch 4.0 spectroscopic ellipsometer is a customer-specific configuration of spectral range, options and field upgradable accessories. SENresearch 4.0 uses fast FTIR ellipsometry for the NIR up to 2,500 nm or 3,500 nm, respectively. It provides broadest spectral range with best S/N ratio and highest, selectable spectral resolution. Silicon films up to 200 µm thickness can be measured. The measurement speed of FTIR ellipsometry compares to diode array configurations, which are also selectable up to 1,700 nm. The new motorized Pyramid Goniometer features an angle range from 20 deg to 100 deg. Optical encoders ensure highest precision and long term stability of angle settings. The spectroscopic ellipsometer arms can be moved independently for scatterometry and angle resolved transmission measurements.
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AvaSpec
AvaSpec-ULS2048x64-EVO
Alongside the cooled AvaSpec-ULS2048x64TEC-EVO with a low-noise detector, Avantes also offers the uncooled AvaSpec-ULS2048x64-EVO. With its standard 2048×64 back-thinned detector, this spectrometer is perfect for less demanding applications in the UV and NIR ranges.
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Portable Spectrometer / Portable Spectrum Analyzer
Optoplex's portable spectrometer / portable near-infrared optical spectrum analyzer (OSA) / mini spectrometer is a valuable spectral module in the Process Analytical Technology (PAT) applications. Portable spectrometer acts as a stand-alone spectral engine, imaging and measuring, through a rapid and nondestructive process, a wide range of vapor, liquids and solids through transmission and diffuse reflection.
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Transmission & Integrating Sphere FT-NIR Spectrometer
QuasIR™ 4000
The QuasIR™ 4000 was designed from the ground up to offer the industry a new kind of NIR analysis solution – a solution that brings together the portability required to move NIR analysis closer to point-of-need, combined with unmatched spectroscopic performance for the fastest and most accurate results.
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FLIM Upgrades for Olympus
FV1000
*Two Fully Parallel TCSPC FLIM Channels*Compact bh Simple-Tau or Power-Tau System*Two HPM-100-40 GaAsP Hybrid Detectors*Optional: HPM-100-06 Hybrid Detectors, IRF Width < 20 ps FWHM*Optional: HPM-100-50 Hybrid Detectors for NIR FLIM*Optional: Multi-Wavelength FLIM*Excitation by bh ps Diode Lasers*Excellent Time Resolution: Electrical IRF Width 6.5 ps FWHM*Time Channel Width Down to 813 fs*Megapixel FLIM, Up to 2048 x 2048 Pixels at 256 Time Channels*Simultaneous FLIM/PLIM*Detection Wavelength Range from 360 nm to 900 nm*Excitation by Ti:Sa Laser, OPO, or by bh ps Diode Lasers*Systems for Multiphoton FLIM and Confocal FLIM*Systems are Modular: More FLIM Channels can be Added
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OSA - OEM Modules
Optoplex’s near-infrared optical spectrum analyzer module (NIR OSA) is a high performance optical spectral engine for Process Analytical Technology (PAT) and Fiber Optic Test Equipment (FOTE) applications. Based on proprietary technologies, Optoplex’s OSA module offers much higher spectral resolution capability than those available in the market, which is demanding in today’s increasing spectroscopy applications. Other features include: compact, light-weight, low power consumption and wide wavelength coverage. Optoplex’s compact OSA engines are suitable for a variety of handheld, portable, bench-top and inline OSA/spectrometer applications.
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Machine Vision Cameras
Manta Series
High-performance industrial cameras with a large choice of sensors, modular options and built-in image optimization. VGA to 12 Megapixels. CCD and CMOS (Sony, CMOSIS). Up to 125 fps. NIR versions, board level option.
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High Accuracy Spectrophotocolorimeter
LMS-3000
• Measure and display the relative spectral power distribution (UV-VIS-NIR) P(λ), chromaticity coordinate, correlated color temperature, rending index, color difference, peak wavelength, luminous flux, luminous flux efficiency and photometry parameters of light source and light material under the control of general PC. • Automatically adjust high-voltage, it not only shortens the measurement time, but also reduces the wear and tear of the instrument • Simultaneously measure the temperature in both environment and integrating sphere to make the data more visually and reliably • Figure of chroma and color difference in test report can be exchanged freely • Color display and print. The relative spectral power distribution (UV-VIS-NIR) P(λ), reports both in English. RS-232-C interface, compatible with all kinds of computer • LSP-500 AC Power source PC RS-232-C interface. compatible with all kinds of computer • Range of wavelength: 380nm～780nm(Special:200nm～780nm) • Accuracy of wavelength: ±0.2nm • Repeatability of wavelength: ±0.1nm • Accuracy of chromaticity coordinate: ±0.0003(under standard illuminate A) • Spectrum sample interval: 5nm(Special order:1nm) • Luminosity linearity: 0.3% • Accuracy of luminosity: 1 class • Correlated color temperature measure range: 1500K～25000K • Accuracy of CCT: ±0.3%(under standard illuminate A) • Accuracy of rending index: ±(0.3%rd±0.3) • Environment temperature measure range: -10℃～80℃ • Temperature measure range(In sphere): -10℃～100℃
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UV/VIS/NIR Spectrophotometer Calibration Standards
As the world's foremost spectrophotometer reference standard manufacturer, we have a dedicated staff and years of experience to back up our products. Our solid state UV/VIS/NIR reference standards are the most stable on the market and remain in spec long after many other manufacturer's standards go bad. Relying on our proprietary nano-deposition technology, you can rest assured that our solid-state standards will produce steady readings for years to come on your machines.
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Spectral Light Meters, UV-VIS-NIR Spectroradiometers
Spectroradiometers for use as portable devices and fixed installation systems for measuring the spectral distribution of sources over the UV-visible-NIR wavelength range in absolute units. We offer all kind of versions for spectral ranges starting at 200 nm to 2150 nm. Direct input optics, optical fibers, radiance optics, etc.
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Single Photon Detector System For Near-Infrared (0.7 - 1.3 Um Wavelength)
Single Photon Detector System for Near-Infrared (0.7 - 1.3 um wavelength) waves with Closed-Cylce (cryogen-free)cooling
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NIR Systems
NIR spectroscopy is a proven analytical method guaranteeing reliable and efficient process monitoring and control in a wide range of process applications.
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Process & Lab FTIR FT-NIR Analyzers
Using a broad spectral region from the near-infrared to the mid-infrared, our Guided Wave ANALECT® Series of FTIR/FT-NIR analyzers measure physical and chemical properties of liquids, solids and gases. They are ideal for complex refinery applications such as fuels blending and component streams applications for polymers, petrochemicals, chemicals, pharmaceuticals in addition to general manufacturing. Customers include ADNOC, BP, CITGO, CPCL, Gazpromneft, HPCL, IOCL, Orpic, Phillips 66, Rompetrol, Statoil, PBF Energy and Tesoro.
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PIN Diodes
PIN photodiodes convert light to current – without a bias voltage having to be applied. Silicon is commonly used as an inexpensive detector material in the Vis range. For higher demands, InGaAs is used; it covers the widest spectral range from the Vis to the NIR. We offer silicon carbide as a “solar-blind” detector specifically for the UV range.
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Thermo-Electrically Cooled Dual Mode Analog/Photon Counting Photmultiplier Tube (PMT)
CoolOne
For spectroscopy and microscopy experiments in the UV/Vis/NIR region of the spectrum, a photomultiplier tube (PMT) is the ideal detector for quantitative low light level measurements. A PMT is extremely sensitive, with very wide dynamic range so it can also measure high levels of light. PMT’s are also very fast so rapid changes in optical signals can be reliably monitored. As a practical matter, PMT’s are durable, long-lived, and economical.
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OMNIR: On-Line Near Infrared Sensor
OMNIR is the future of near infrared moisture sensing technology. Coming from OMNI, meaning “all” and NIR, meaning “near infrared,” Finna Sensors has created an intelligent all-sensing solution that exceeds expectations. It not only delivers accurate data instantaneously and non-destructively, it also monitors its own health to perform its best during your crucial processing moments. By selectively harnessing light, to ensure increased uptime and greater profitability for your operation, the future of your manufacturing operation starts now.
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SiTek Standard PSD
1L20_CP3
The SiTek Standard PSD (Position Sensing Detector) has high resolution, fast response and outstanding linearity. It is used in a wide variety of applications, most of them utilizing light sources in the visible or near-infrared part of the spectrum. The spectral range covers the region 400 - 1100 nm. Thanks to SiTek's proprietary AR-coating, optimized around 860 nm, a reflection loss of only 2% is achieved around the responsivity peak. Most of the detectors have a cover window to avoid handling damages.
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Turbidity Probe
AS16-N
High precision probe for direct installation into pipelines and vessels measuring NIR light absorption (turbidity) of various liquid samples. The optical path length can be individually configured to meet the process control requirements with the highest accuracy.
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LEDs
Opto Diode manufactures best-in-class light-emitting diodes (LEDs) for a wide variety of applications that require rugged, hermetically-sealed packaging that can withstand extreme temperatures. Choose from our visible, near-infrared in wide, medium or narrow light patterns, our high-output visible LEDs in red or blue with narrow beam angles, or our high-power near-IR LEDs for night vision and surveillance applications. Ideal for medical, automotive, scientific, commercial, imaging, aerospace, and other demanding military or industrial tasks.
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Single Photon Detector System For Near-Infrared (1.3-1.6 Um Wavelength) Waves With Closed-Cyle Cooling
Insight Product Company is proud to offer Single Photon Detector System for Near-Infrared (1.3-1.6 um wavelength) waves with Closed-Cylce (cryogen-free)cooling .
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Uniform Light Sources
It includes universal mounting points and wireless light controls. It is offered with a variety of color temperatures as well as near-infrared.
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Scatterometers/ Thin Film Metrology Systems
LittleFoot Series
The n&k LittleFoot-CD, and LittleFoot-CD450 are DUV-Vis-NIR scatterometers/thin film metrology systems, based on polarized reflectance measurements (Rs and Rp) from 190nm to 1000nm, with microspot technology. The systems in the LittleFoot-CD Series determine thickness, n and k spectra from 190nm-1000nm of thin films, as well as depths, CDs, and profiles of trenches and contact holes.
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UV-VIS-NIR Spectrophotometer
UV-2600i, UV-2700i
The compact UV-2600i/2700i is a universal, research-grade spectrophotometer that can be used in a wide range of fields, and easily expanded to suit the measurement objective. By using the optional integrating sphere, the measurement wavelength range of the UV-2600 can be extended to the near-infrared region of 1400 nm. The UV-2700 is capable of 8-Abs measurements, and optimal for measuring low transmittance samples.
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Turbidity Sensor
TF56-N
The TF56-N sensor is an inline real-time device designed to measure light absorbance at 11° caused by interaction with process turbidity. As an NIR light beam is passed through a dynamic process stream, the sensor simultaneously measures the amount of light scattered at 11° and the remaining amount of un-scattered light at 0°.
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NIR Macro Lens
ML-4
With the ML-4 macro lens, Korima takes the job to an even higher level of certainty and simplicity. Through the ML-4, failure analysts can examine an entire microcircuit at once--rather than in a sequence of small, individual areas.
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NIR Grain Analyser
Perten Inframatic 8800
Portable NIR Instrument for protein, moisture and oil determination in grain and oilseed. The design is rugged, robust and simple to operate, but sophisticated enough to provide accuracy similar to elevator and lab instruments.
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Deep Cooled UV/Vis/NIR and VUV Scientific Cameras
Syncerity Scientific Cameras
HORIBA Scientific offers a complete line of spectroscopic multi-channel detectors for scientific research. For spectral detection from UV to near-IR, two dimensional CCDs offering a faster acquisition option over single point detectors with relatively high sensitivity. Coupled with HORIBA’s range of aberration corrected flat field imaging spectrographs, OEM packages can be assembled for a variety of applications.
