Showing results: 1 - 15 of 43 items found.
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Mad City Labs Inc.
The Nano-Gauge™ is an ultra high precision, single axis, displacement measuring instrument capable of resolving dimensions down to 1.5 nanometers (0.06 microinches) over a full scale range of 25mm (1 inch). Combining ease-of-use and small physical size, the Nano-Gauge™ can be quickly adapted to a wide variety of precision measurement situations without lengthy or complex setup procedures.
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Focused Photonics Inc.
Ultraviolet light is electromagnetic radiation of wavelengths of 10–400 nanometers, shorter than that of visible light, but longer than X-rays.
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FISCHERSCOPE® HM2000 -
Helmut Fischer AG
Nanoindentation for professionals. Reliable hardness measuring instrument for determining properties such as indentation hardness and the depth-dependent elastic indenter modulus – and all of that in the nanometer range.
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Hiden Analytical Ltd.
A UHV surface analysis system for thin film depth profilingMeasures the surface composition of the first few nanometers and/or micrometers depth of solid samples.
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MX 10x series -
E+H Metrology GmbH
The MX10x series measure thickness and thickness variation on silicon wafers. It has a resolution of 10 nanometers and can be adapted to different thickness ranges within a few seconds.
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Allalin -
Attolight AG
The Allalin is a nanometer resolution spectroscopy instrument, based on a disruptive technology known as quantitative cathodoluminescence that integrates a light microscope and a scanning electron microscope (SEM) into one tool.
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SMT-9700 -
Kaman Fuzing & Precision Products
* 1, 2 and 3 channel configurations* Nanometer to sub-nanometer resolution* Easy, cost-effective performance customization* CE and RoHS compliant* Small package size* Thirteen standard sensor options
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piezosystems jena, Inc.
For hpower high-power actuators, high-power amplifiers are required. Together these hpower actuators and amplifier systems deliver exceptionally fast response times, superior dynamics, high force generation, and nanometer precision.
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ISRA Vision AG
Ensure that components function and can be fitted correctly with efficient form monitoring. ISRA’s 3D form measurement systems capture component geometries down to the nanometer level while ensuring the shortest cycle times.
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OLS4100 -
Olympus Corp.
The LEXT OLS4100 is a Laser Scanning Microscope to perform non-contact 3D observations and measurements of surface features at 10 nanometer resolutions. It also features a fast image acquisition and a high-resolution image over a wider area.
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LIGHTsPEED -
Unity Semiconductor SAS
High throughput• Nanometer scale sensitivity• Autofocus• Full haze characterization• Multisize capability• Pits / Particle distinction• High lifetime / low CoO solid state laser• Advanced Automatic Defect Classification
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ISRA Vision AG
Ensure zero-defect quality in all product deliveries and boost customer satisfaction: ISRA’s precision metrology systems measure all object and surface properties down to the nanometer level while ensuring the shortest cycle times.
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FlowCam Nano -
Fluid Imaging Technologies
FlowCam Nano is the next-generation dynamic image analysis instrument for submicron particle imaging and sizing in real-time. FlowCam Nano extends subvisible particle analysis to detect objects between 300 nanometers and 2 micrometers - the smallest visible with light microscopy.
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LDS-7200 -
PSE Technology
5 nanometers tuning range• 10 picometer setpoint accuracy• 0.1 picometer resolution• 20mW output power• 0.005 dB power stability• Built-in coherence control• Integrated function generator• USB remote interface• Application program with source code
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ONI
Harness the power of single-molecule localization microscopy to characterize EVs across scales. Quantify nanometer small, rare, and precious EV samples with super-resolution precision. ONI’s EV Profiler helps you focus on answering the right questions about your EV populations.