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- Pickering Interfaces Ltd.
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PCI RF Switch Cards
These 8x9 RF Switch Cards are suitable for switching frequencies up to 500MHz. Available in either 50 or 75 versions with SMB coaxial connectors. These switch cards are intended for the easy construction of high-performance bidirectional matrix switching systems. Automatic isolation switches are located on all coaxial connections, these disconnect the matrix from the external test fixture. This maximizes isolation and RF performance.
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Test Switches
RTS
STATES Type RTS Test Switches are designed to simplify and speed testing and check-out of relay, control and instrumentation systems. They eliminate the need to change connections and prevent open-circuiting CTs during tests.
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Test Switches
Series FT
An industry standard for CT & VT isolationfor instrument transformer and connected device testing.Up to 10 poles; Numerous configurations availableTypically mounted on switchgear and relay panels10 pole test plug available; UL and cUL recognized.
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Test Switches
Series RT
Up to three Series FT switches can beassembled on various size 19" wide panels. One piece clear cover standardPanels available in choice of colors and materials
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Test Switches
Designed and manufactured to allow quick and easy multi-circuit testing of switchboard relays, meters and instruments by any conventional system.
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Test Switches and Accessories
Test switches are designed and manufactured to allow quick and easy multi-circuit testing of switchboard relays, meters and instruments by any conventional system.These test switches and related test plugs have the features necessary for applications involving the measurement of individual currents and voltages associated with substation instrumentation and protection devices. They have been especially designed for the measurement of potential elements, current elements, and make-before-break short-circuit elements related to Current Transformer (CT) circuits.
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Meter Test Switches
Meter Test
TESCO introduced the original Meter Test Switch in the early 1920's. TESCO's current line of Test Switches have been designed with the intention to combine the best features of tried and proven switching methods with improvements in materials and construction.
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Meter Test Switches
TESCO introduced the original Meter Test Switch in the early 1920’s. Today, TESCO’s line of Test Switches has been redesigned with the intention to combine the best features of tried and proven switching methods with improvements in materials and construction. All of the current carrying parts are bright tin plated to prevent corrosion. Good operating contact is assured on periodic meter tests, even when the switch has been idle for long periods of time in an unfavorable atmosphere.
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Flight Test Switches
Curtiss-Wright Defense Solutions
Our compact, deterministic flight test switches have been qualified to reliably deliver high-speed, real-time data with a wide temperature operation ranging from -40 to 85°C. Their rapid boot-up capability minimizes data loss from power outages, while their flexible forwarding and filtering configurations can send what is required to multiple destinations for real-time monitoring, recording, and transmission. Our selection of flight test switches includes support for IEEE-1588 PTP, embedded v1 and v2 Grandmaster support and translation, and GPS and digital IRIG-B input and output. We also offer additional hardware to translate between PCM/CAIS and Ethernet to help protect existing hardware investment and have participated in the TmNS program by developing leading-edge technology for complete network monitoring and control.
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Test Switches and Accessories
FT Flexitest Family
The ABB FT test kit comes with a convenient carrying case to hold your hand held meter, test plugs patch cords, clips, and test probes in neat order. Patch cords are highly durable and flexible. Test switch accessories include: Test plugs Test kits Covers Interlocking bars Miscellaneous
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Test Equipment Grade Switches
Multi-Tech Industries also manufacturers a line of quality instrument-grade electromechanical switches for commercial, industrial, military, institutional and OEM applications. Rotary switches (open frame, enclosed frame), thumbwheel, keyreader and other types are available to be integrated into your process controls or test instrumentation. Standard and custom switch designs can be modified to meet specific customer requirements.
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Test & Measurement Matrix Switches
Quintech Electronics and Communications Inc.
Quintech Electronics & Communications, Inc. have provided keystone NEXUS brand Test & Measurement matrix switches to tier one wireless testing laboratories around the world. These RF matrix switching systems allow for wireless test lab automation providing repeatable, recordable and remotely controlled testing. Our global customer base includes network service providers, network equipment, chipset, and device and UE manufacturers. This automation is critical for the complex, ever changing wireless environment referred to as 4G, 5G Wi-Fi, LTE, LTE-U, IoT, commonly referenced with regard to convergence and the networked society.
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Automated Optical Switch - PXI
Add optical switching capability to your test system with Quantifi Photonics’ automated optical switches. The fast and reliable optical switch will enable automated sequential testing, saving time and streamlining your test procedures.
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Automated Optical Switch - MATRIQ
Add optical switching capability to your test system with Quantifi Photonics’ automated optical switches. The fast and reliable optical switch will enable automated sequential testing, saving time and streamlining your test procedures.
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EFT Module for Teststand
The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
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Test Solutions
Our range of test solutions is far reaching, comprised of off-the-shelf test instruments and interfaces, standard automated test systems, and custom solutions for test, simulation, and training. Put our E2E focus and experience to work for you with these solutions: automated test equipment, maintenance trainers, and test management software.
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Tactical Radio Test Set
CTS-6010
The CTS-6010 brings an entire test bench to your front lines. Enable your technicians to detect equipment faults and verify operational capabilities at the I- and O-levels, saving valuable diagnostic time and cost.
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PCI Express 5.0 Test Platform
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
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PCIe 5.0 Test Platform
PXP-500A
The Teledyne LeCroy PXP-500A Test Platform provides a convenient means for testing PCIe 5.0 cards with a self-contained portable and powered passive backplane. The PXP-500A provides power required for both cards under test.
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ARINC 818 Tester
iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces
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Automatic Test System
Automatic Test system is the ultimate solution for power electronic testing. The system includes a wide range of hardware choice such as AC/DC Sources, Electronic Loads, DMM, Oscillate Scope, Noise Analyzer and Short /OVP Tester. This flexibility combined with its open architecture software platform-PowerPro III, gives users a flexible, powerful and cost effective test system for almost all types of power supply testing.
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SoC Test System
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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Semiconductor Test System
TS-960e
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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VLSI Test System
3380P
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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VLSI Test System
3380D
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.
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OLED Lifetime Test System
58131
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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Regenerative Battery Pack Test System
17020E
Charge/discharge modes (CC, CV, CP)Power Range: 10kW / 20kW per channelVoltage Range: 60V/ 100VCurrent Range: 100A/200A/300A/400A/ 500A/600A/700A/800A per channelRegenerative battery energy discharge, efficiency 85%Channels paralleled for higher currentsDriving cycle simulationFast current conversion without current interruptHigh precision measurementSmooth current without over shootTest data analysis functionData recovery protection (after power failure)Independent protection of multi-channel
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Photodiode Burn-in Reliability Test System
58606
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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Regenerative Battery Pack Test System
17040E
High-power testing equipment up to 1,700V/ 4800A/ 1.2MW Multiple safety protections for personnel safety risk management and control of battery testing Flexible Integration for automated battery verification solutions
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Photonics Module Test System
58625
Chroma 58625 provides characterization testing for 3D sensing illumination devices. various test modules are combined for validation testing under precise temperature control.
